Scanning electron microscopy and x-ray microanalysis / / ; Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick.; Joy, David C.; Lyman, Charles E.; Lifshin, Eric.; Sawyer, Linda.; Michael, Joseph R.. -- 3td ed. -- New York : Springer, 2003.
xix, 690 p. :
ISBN 9781461349693
57.086/.088
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