Pattern Classification / Duda, Richard O.; Hart, Peter E.; Stork, David G.. -- 2nd ed. -- New York : Wiley, 2001.
xx, 654 p.
1- Introduction;2- Bayesian decision theory;3- Maximum-Likelihood and bayesian parameter estimation;4- Nonpara metric techniques;5- Linear discriminant functions;6- Multilayer neural networks;7- Stochastic methods;8- Nonmetric methods;9- Algorithm-independent machine learning;10- Unsupervised learning and clustering
ISBN 0471056693
519.22
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