Identificacion Principal del registro INGC-EBK-000133

Control Number Identifier AR-LpUFI

LAST MODIFICATION DATE 20160906131055

CONTROL FIELD cr nn 008mamaa

CONTROL FIELD 131209s2014 xxu| s |||| 0|eng d

a International Standard Book Number 9781461492870

a Standard number or code 10.1007/978-1-4614-9287-0

a Personal name Wang, Gwo-Ching.

a Title RHEED Transmission Mode and Pole Figures

h Medium [libro electrónico] : ;

b Remainder of title Thin Film and Nanostructure Texture Analysis /

c Statement of responsibility, etc by Gwo-Ching Wang, Toh-Ming Lu.

a Place of publication, distribution, etc New York, NY :

b Name of publisher, distributor, etc Springer New York :

b Name of publisher, distributor, etc Imprint: Springer,

c Date of publication, distribution, etc 2014.

a Extent xii, 227 p. :

b Other physical details il.

a Formatted contents note Introduction -- Crystal Lattices and Reciprocal Lattices -- Kinematic Scattering of Waves and Diffraction Conditions -- RHEED Reflection Mode -- X-Ray Diffraction -- RHEED Transmission Mode and RHEED Pole Figure -- Instrumentation for RHEED Pole Figure -- Origins of Texture Formation -- Techniques to Control Thin Film Textures -- Applications and Future Direction -- Appendix A: Operational Procedures for RHEED Pole Figure -- Appendix B: RHEED Pattern Simulations.    .

a Summary, etc This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of thin films and nanostructures. Also presented is a new application of RHEED in the transmission mode called RHEED pole figure technique that can be used to monitor the texture evolution in thin film growth and nanostructures and is not limited to single crystal epitaxial film growth. Details of the construction of RHEED pole figures and the interpretation of observed pole figures are presented.  Materials covered include metals, semiconductors, and thin insulators. This book also: Presents a new application of RHEED in the transmission mode Introduces a variety of textures from metals, semiconductors, compound semiconductors, and their characteristics in RHEED pole figures Provides examples of RHEED measurements of texture and texture evolution, construction of RHEED pole figures, and interpretation of observed pole figures RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis is ideal for researchers in materials science and engineering and nanotechnology.  .

a Topical term or geographic name as entry element Engineering.

a Topical term or geographic name as entry element Nanotechnology.

a Topical term or geographic name as entry element Materials science.

a Topical term or geographic name as entry element Materials

a Topical term or geographic name as entry element Thin films.

a Topical term or geographic name as entry element Microengineering.

a Topical term or geographic name as entry element Surfaces and Interfaces, Thin Films.

a Topical term or geographic name as entry element Characterization and Evaluation of Materials.

a Personal name Lu, Toh-Ming.

u Uniform Resource Identifier (R) http://dx.doi.org/10.1007/978-1-4614-9287-0

c item type EBK

a descripción COM