001 -Identificacion Principal del registro
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Identificacion Principal del registro
INGC-EBK-000737
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003 -Control Number Identifier
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Control Number Identifier
AR-LpUFI
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005 -LAST MODIFICATION DATE
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LAST MODIFICATION DATE
20160920095544
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007 -CONTROL FIELD
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CONTROL FIELD
cr nn 008mamaa
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008 -CONTROL FIELD
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CONTROL FIELD
140421s2014 gw | s |||| 0|eng d
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020 -INTERNATIONAL STANDARD BOOK NUMBER
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a
International Standard Book Number
9783642542985
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024 -OTHER STANDARD IDENTIFIER
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a
Standard number or code
10.1007/978-3-642-54298-5
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100 -MAIN ENTRY--PERSONAL NAME
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a
Personal name
Yu, Wenjian.
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245 -TITLE STATEMENT
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a
Title
Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits
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h
Medium
[libro electrónico] /
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c
Statement of responsibility, etc
by Wenjian Yu, Xiren Wang.
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260 -PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
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a
Place of publication, distribution, etc
Berlin, Heidelberg :
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b
Name of publisher, distributor, etc
Springer Berlin Heidelberg :
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b
Name of publisher, distributor, etc
Imprint: Springer,
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c
Date of publication, distribution, etc
2014.
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300 -PHYSICAL DESCRIPTION
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a
Extent
xv, 246 p. :
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b
Other physical details
il.
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505 -FORMATTED CONTENTS NOTE
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a
Formatted contents note
Introduction -- Basic Field-Solver Techniques for RC Extraction -- Fast Boundary Element Methods for Capacitance Extraction (I) -- Fast Boundary Element Methods for Capacitance Extraction (II) -- Resistance Extraction of Complex 3-D Interconnects -- Substrate Resistance Extraction with Boundary Element Method -- Extracting Frequency-Dependent Substrate Parasitics -- Process Variation Aware Capacitance Extraction -- Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model -- Fast Floating Random Walk Method for Capacitance Extraction -- FRW Based Solver for Chip-Scale Large Structures.
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520 -SUMMARY, ETC.
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a
Summary, etc
Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Computer simulation.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Computer-aided engineering.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Computer mathematics.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Electronic circuits.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Engineering.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Circuits and Systems.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Numerical Analysis.
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650 -SUBJECT ADDED ENTRY--TOPICAL TERM
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a
Topical term or geographic name as entry element
Simulation and Modeling.
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700 -ADDED ENTRY--PERSONAL NAME
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a
Personal name
Wang, Xiren.
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856 -ELECTRONIC LOCATION AND ACCESS
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u
Uniform Resource Identifier (R)
http://dx.doi.org/10.1007/978-3-642-54298-5
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942 -Biblioitem information
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929 -Medio de adquisicion
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