Identificacion Principal del registro INGC-EBK-000893

Control Number Identifier AR-LpUFI

LAST MODIFICATION DATE 20160920104546

CONTROL FIELD cr nn 008mamaa

CONTROL FIELD 131113s2014 ne | s |||| 0|eng d

a International Standard Book Number 9789400777811

a Standard number or code 10.1007/978-94-007-7781-1

a Personal name Zjajo, Amir.

a Title Stochastic Process Variation in Deep-Submicron CMOS

h Medium [libro electrónico] : ;

b Remainder of title Circuits and Algorithms /

c Statement of responsibility, etc by Amir Zjajo.

a Place of publication, distribution, etc Dordrecht :

b Name of publisher, distributor, etc Springer Netherlands :

b Name of publisher, distributor, etc Imprint: Springer,

c Date of publication, distribution, etc 2014.

a Extent xix, 192 p. :

b Other physical details il.

a Series statement Springer Series in Advanced Microelectronics,

x International Standard Serial Number 1437-0387 ;

v Volume number/sequential designation 48

a Formatted contents note 1 Introduction -- 2 Random Process Variation in Deep-Submicron CMOS -- 3 Electronic Noise in Deep-Submicron CMOS -- 4 Thermal Effects in Deep-Submicron CMOS -- 5 Circuit Solutions -- 6 Conclusions and Recommendations -- Appendix. References -- Acknowledgement -- About the Author.

a Summary, etc One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.  .

a Topical term or geographic name as entry element Biomathematics.

a Topical term or geographic name as entry element Electronic circuits.

a Topical term or geographic name as entry element Statistical physics.

a Topical term or geographic name as entry element Dynamical systems.

a Topical term or geographic name as entry element Applied mathematics.

a Topical term or geographic name as entry element Engineering mathematics.

a Topical term or geographic name as entry element Physics.

a Topical term or geographic name as entry element Electronic Circuits and Devices.

a Topical term or geographic name as entry element Circuits and Systems.

a Topical term or geographic name as entry element Complexity.

a Topical term or geographic name as entry element Computational Methods of Engineering.

a Topical term or geographic name as entry element Physiological, Cellular and Medical Topics.

u Uniform Resource Identifier (R) http://dx.doi.org/10.1007/978-94-007-7781-1

c item type EBK

a descripción COM