Trace-Based Post-Silicon Validation for VLSI Circuits   / Liu, Xiao.; Xu, Qiang. -- Heidelberg :Springer International Publishing :;Imprint: Springer,2014.

xv, 108 p. :

Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion.

ISBN 9783319005331