Identificacion Principal del registro INGC-EBK-000171

Control Number Identifier AR-LpUFI

LAST MODIFICATION DATE 20160826105757

CONTROL FIELD cr nn 008mamaa

CONTROL FIELD 130611s2014 gw | s |||| 0|eng d

a International Standard Book Number 9783319005331

a Standard number or code 10.1007/978-3-319-00533-1

a Personal name Liu, Xiao.

a Title Trace-Based Post-Silicon Validation for VLSI Circuits

h Medium [libro electrónico] /

c Statement of responsibility, etc by Xiao Liu, Qiang Xu.

a Place of publication, distribution, etc Heidelberg :

b Name of publisher, distributor, etc Springer International Publishing :

b Name of publisher, distributor, etc Imprint: Springer,

c Date of publication, distribution, etc 2014.

a Extent xv, 108 p. :

b Other physical details il.

a Series statement Lecture Notes in Electrical Engineering,

x International Standard Serial Number 1876-1100 ;

v Volume number/sequential designation 252

a Formatted contents note Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion.

a Summary, etc This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. ·         Provides a comprehensive summary of state-of-the-art on post-silicon validation; ·         Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; ·         Illustrate key concepts and algorithms with real examples.        .

a Topical term or geographic name as entry element Engineering.

a Topical term or geographic name as entry element Microprocessors.

a Topical term or geographic name as entry element Semiconductors.

a Topical term or geographic name as entry element Electronic circuits.

a Topical term or geographic name as entry element Circuits and Systems.

a Topical term or geographic name as entry element Processor Architectures.

a Personal name Xu, Qiang.

u Uniform Resource Identifier (R) http://dx.doi.org/10.1007/978-3-319-00533-1

c item type EBK

a descripción COM