| |
 |
Biblioteca Julio Castiñeiras. Sistema de Información Integrado - Facultad de Ingeniería UNLP
Facultad de Ingeniería | 115 esq.47 | Horario: Lunes a Viernes 8 a 19 hs.
E-mail: bibcentral@ing.unlp.edu.ar
|
|
|
|
|
|
|
|
|
|
|
Información bibliografica (registro INGC-EBK-000171) |
|
|
|
Título: |
Trace-Based Post-Silicon Validation for VLSI Circuits by Xiao Liu, Qiang Xu. |
|
Autor:
|
Liu, Xiao.
|
Otros autores: |
|
Xu, Qiang.
|
|
Editado por: |
Springer International Publishing :;Imprint: Springer,
|
Año de publicación: |
2014.
|
Lugar de publicación: |
Heidelberg :
|
Descripción física: |
xv, 108 p. : il. |
ISBN: |
9783319005331
|
Colección: |
Lecture Notes in Electrical Engineering,
|
Materias: |
|
Processor Architectures. |
Circuits and Systems. |
Electronic circuits. |
Semiconductors. |
Microprocessors. |
Engineering. |
|
Notas: |
Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion. |
Sumario: |
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. ·        Provides a comprehensive summary of state-of-the-art on post-silicon validation; ·        Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; ·        Illustrate key concepts and algorithms with real examples.     . |
URL: |
http://dx.doi.org/10.1007/978-3-319-00533-1
|
|
|
Tapa y contenido (Amazon.com) |
|
|
El software empleado por esta biblioteca esta basado en el
Koha
Software OSS para gestion de Bibliotecas, y cumple estándares internacionales de informacion web
Número de visitantes:
|
|
|
